A COMPUTER-SIMULATED ELECTRON-DIFFRACTION ANALYSIS AND ITS APPLICATIONS
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | LEE, CS | ko |
| dc.contributor.author | KIM, JW | ko |
| dc.contributor.author | PARK, CN | ko |
| dc.contributor.author | Kim, Young-Gil | ko |
| dc.date.accessioned | 2013-04-11T09:01:08Z | - |
| dc.date.available | 2013-04-11T09:01:08Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1990-04 | - |
| dc.identifier.citation | SCRIPTA METALLURGICA ET MATERIALIA, v.24, no.4, pp.639 - 644 | - |
| dc.identifier.issn | 0956-716X | - |
| dc.identifier.uri | http://hdl.handle.net/10203/173530 | - |
| dc.language | English | - |
| dc.publisher | PERGAMON-ELSEVIER SCIENCE LTD | - |
| dc.title | A COMPUTER-SIMULATED ELECTRON-DIFFRACTION ANALYSIS AND ITS APPLICATIONS | - |
| dc.type | Article | - |
| dc.identifier.wosid | A1990CW77400007 | - |
| dc.identifier.scopusid | 2-s2.0-0025406369 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 24 | - |
| dc.citation.issue | 4 | - |
| dc.citation.beginningpage | 639 | - |
| dc.citation.endingpage | 644 | - |
| dc.citation.publicationname | SCRIPTA METALLURGICA ET MATERIALIA | - |
| dc.contributor.localauthor | Kim, Young-Gil | - |
| dc.contributor.nonIdAuthor | LEE, CS | - |
| dc.contributor.nonIdAuthor | KIM, JW | - |
| dc.contributor.nonIdAuthor | PARK, CN | - |
| dc.type.journalArticle | Article | - |
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