Full quantum-mechanical calculation of surface-roughness- limited mobility and mean-free-path in Si nanowire FETs
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Shin, Mincheol | - |
| dc.date.accessioned | 2013-03-29T18:04:06Z | - |
| dc.date.available | 2013-03-29T18:04:06Z | - |
| dc.date.created | 2012-12-03 | - |
| dc.date.issued | 2012-10-25 | - |
| dc.identifier.citation | Nano-S&T 2012, v., no., pp. - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/172665 | - |
| dc.language | ENG | - |
| dc.title | Full quantum-mechanical calculation of surface-roughness- limited mobility and mean-free-path in Si nanowire FETs | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | Nano-S&T 2012 | - |
| dc.identifier.conferencecountry | China | - |
| dc.contributor.localauthor | Shin, Mincheol | - |
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