Exploring the Opportunity of Optimizing Sequencing Elements in ASIC Designs

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dc.contributor.authorPaik, Seungwhun-
dc.contributor.authorKung, Jaeha-
dc.contributor.authorShin, Youngsoo-
dc.date.accessioned2013-03-29T17:30:11Z-
dc.date.available2013-03-29T17:30:11Z-
dc.date.created2012-11-30-
dc.date.issued2011-08-09-
dc.identifier.citationThe 54th IEEE Ineternational Midwest Symposium on Circuits and Systems (MWSCAS), pp.394 - 397-
dc.identifier.urihttp://hdl.handle.net/10203/172497-
dc.description.abstractAn edge-triggered flip-flop is a de facto standard sequencing element in ASIC designs. As sequencing elements occupy increasing portion of timing and power, it is necessary to explore other types of elements. We identify pulsed-latch and dual edge-triggered flip-flop as two promising candidates. The challenges when they are employed for conventional ASIC design are identified, and potential solutions are addressed.-
dc.languageEnglish-
dc.publisherIEEE-
dc.titleExploring the Opportunity of Optimizing Sequencing Elements in ASIC Designs-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage394-
dc.citation.endingpage397-
dc.citation.publicationnameThe 54th IEEE Ineternational Midwest Symposium on Circuits and Systems (MWSCAS)-
dc.identifier.conferencecountryKO-
dc.identifier.conferencelocationSeoul-
dc.contributor.localauthorShin, Youngsoo-
dc.contributor.nonIdAuthorPaik, Seungwhun-
dc.contributor.nonIdAuthorKung, Jaeha-

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