Modeling and verification to analyze effect of power/ground noises on CMOS feedback operational amplifier
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Shim, Y. | ko |
| dc.contributor.author | Park, J. | ko |
| dc.contributor.author | Shim, J. | ko |
| dc.contributor.author | Kim, Joungho | ko |
| dc.date.accessioned | 2010-03-08T05:24:53Z | - |
| dc.date.available | 2010-03-08T05:24:53Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2007-07-09 | - |
| dc.identifier.citation | IEEE International Symposium on Electromagnetic Compatibility, EMC 2007, pp.1 - 7 | - |
| dc.identifier.issn | 1077-4076 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/17007 | - |
| dc.language | English | - |
| dc.language.iso | en_US | en |
| dc.publisher | IEEE | - |
| dc.title | Modeling and verification to analyze effect of power/ground noises on CMOS feedback operational amplifier | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000254096000183 | - |
| dc.identifier.scopusid | 2-s2.0-47749097566 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 1 | - |
| dc.citation.endingpage | 7 | - |
| dc.citation.publicationname | IEEE International Symposium on Electromagnetic Compatibility, EMC 2007 | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | Honolulu, HI | - |
| dc.embargo.liftdate | 9999-12-31 | - |
| dc.embargo.terms | 9999-12-31 | - |
| dc.contributor.localauthor | Kim, Joungho | - |
| dc.contributor.nonIdAuthor | Shim, Y. | - |
| dc.contributor.nonIdAuthor | Park, J. | - |
| dc.contributor.nonIdAuthor | Shim, J. | - |
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