Self-reference extended depth-of-field quantitative phase microscopyJ. Jang, C. Y. Bae, J. K. Park, J. C. Ye
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Jang, J | - |
| dc.contributor.author | Bae, CY | - |
| dc.contributor.author | Park Je-Kyun | - |
| dc.contributor.author | Ye J. C. | - |
| dc.date.accessioned | 2013-03-29T10:23:03Z | - |
| dc.date.available | 2013-03-29T10:23:03Z | - |
| dc.date.created | 2012-07-02 | - |
| dc.date.issued | 2010-01 | - |
| dc.identifier.citation | SPIE Conference, v., no., pp. - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/170037 | - |
| dc.language | ENG | - |
| dc.publisher | SPIE | - |
| dc.title | Self-reference extended depth-of-field quantitative phase microscopy | - |
| dc.title.alternative | J. Jang, C. Y. Bae, J. K. Park, J. C. Ye | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | SPIE Conference | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Park Je-Kyun | - |
| dc.contributor.nonIdAuthor | Jang, J | - |
| dc.contributor.nonIdAuthor | Bae, CY | - |
| dc.contributor.nonIdAuthor | Ye J. C. | - |
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