High dielectric constant thin film EBG power/ground network for broad-band suppression of SSN and radiated emissions

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dc.contributor.authorLee, Jko
dc.contributor.authorKim, Hko
dc.contributor.authorKim, Jounghoko
dc.date.accessioned2010-03-05T01:42:03Z-
dc.date.available2010-03-05T01:42:03Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2005-08-
dc.identifier.citationIEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.15, pp.505 - 507-
dc.identifier.issn1531-1309-
dc.identifier.urihttp://hdl.handle.net/10203/16965-
dc.description.abstractWe experimentally demonstrated the great advantages of a high dielectric constant thin film electromagnetic bandgap (EBG) power distribution network (PDN) for the suppression of power/ground noises and radiated emissions in high-performance multilayer digital printed circuit boards (PCBs). Five-layer test PCBs were fabricated and their scattering parameters measured. The power plane noise and radiated emissions were measured, investigated and related to the PDN impedance. This successfully demonstrated that the bandgap of the EBG was extended more than three times, covering a range of hundreds of MHz using a 1-cm x 1-cm EBG cell, the SSN was reduced from 170 mV to 10 mV and the radiated emission was suppressed by 22 dB because of the high dielectric constant thin film EBG power/ground network.-
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subjectNOISE-
dc.subjectIMPEDANCE-
dc.subjectPACKAGES-
dc.titleHigh dielectric constant thin film EBG power/ground network for broad-band suppression of SSN and radiated emissions-
dc.typeArticle-
dc.identifier.wosid000230936600005-
dc.identifier.scopusid2-s2.0-25144490014-
dc.type.rimsART-
dc.citation.volume15-
dc.citation.beginningpage505-
dc.citation.endingpage507-
dc.citation.publicationnameIEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS-
dc.identifier.doi10.1109/LMWC.2005.852779-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorKim, Joungho-
dc.contributor.nonIdAuthorLee, J-
dc.contributor.nonIdAuthorKim, H-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorelectromagnetic bandgap (EBG)-
dc.subject.keywordAuthorpower distribution network impedance-
dc.subject.keywordAuthorradiated emission-
dc.subject.keywordAuthorsimultaneous switching noise (SSN)-
dc.subject.keywordPlusNOISE-
dc.subject.keywordPlusIMPEDANCE-
dc.subject.keywordPlusPACKAGES-
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