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College of Engineering(공과대학)School of Mechanical and Aerospace Engineering(기계항공공학부)Dept. of Mechanical Engineering(기계공학과)ME-Journal Papers(저널논문)

ABERRATION CORRECTED BEAM SCANNING STIMULATED EMISSION DEPLETION MICROSCOPY

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dc.contributor.authorYoo, Hongkiko
dc.contributor.authorSong, Incheonko
dc.contributor.authorGweon, Dae-Gabko
dc.date.accessioned2010-02-10T06:22:18Z-
dc.date.available2010-02-10T06:22:18Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2008-
dc.identifier.citationINTERNATIONAL JOURNAL OF OPTOMECHATRONICS, v.2, no.4, pp.401 - 412-
dc.identifier.issn1559-9612-
dc.identifier.urihttp://hdl.handle.net/10203/16595-
dc.description.abstractWe present an aberration corrected beam scanning stimulated emission depletion (STED) microscopy. The beam scanning is essential to get images fast for practical usages in the biological applications. In this work the beam scanning method is applied to the STED microscopy. To maintain the imaging performance optimally, the aberration induced by the optic components, especially beam scanning parts, is corrected using adaptive optics. Thus, high resolution over the diffraction limit and high scanning speed are achieved without resolution and signal loss caused by the aberration.-
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherTAYLOR FRANCIS INC-
dc.titleABERRATION CORRECTED BEAM SCANNING STIMULATED EMISSION DEPLETION MICROSCOPY-
dc.typeArticle-
dc.identifier.wosid000270085400004-
dc.identifier.scopusid2-s2.0-56349163374-
dc.type.rimsART-
dc.citation.volume2-
dc.citation.issue4-
dc.citation.beginningpage401-
dc.citation.endingpage412-
dc.citation.publicationnameINTERNATIONAL JOURNAL OF OPTOMECHATRONICS-
dc.identifier.doi10.1080/15599610802564550-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorYoo, Hongki-
dc.contributor.localauthorGweon, Dae-Gab-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordPlusFLUORESCENCE MICROSCOPY-
dc.subject.keywordPlusCONFOCAL MICROSCOPY-
dc.subject.keywordPlusRESOLUTION-
dc.subject.keywordPlusSYSTEM-
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ME-Journal Papers(저널논문)
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