DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, DY | ko |
dc.contributor.author | Lee, MY | ko |
dc.contributor.author | Gweon, Dae-Gab | ko |
dc.date.accessioned | 2010-02-10T05:44:02Z | - |
dc.date.available | 2010-02-10T05:44:02Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2006-04 | - |
dc.identifier.citation | JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, v.45, no.12-16, pp.L370 - L372 | - |
dc.identifier.issn | 0021-4922 | - |
dc.identifier.uri | http://hdl.handle.net/10203/16583 | - |
dc.description.abstract | A planar scanner of an atomic force microscope (AFM) can move samples to within a few nm of resolution. Tube piezoelectric actuators have coupling errors, that can be eliminated by software correction; however, residual errors can deteriorate the actual information in a small-feature sample. To obtain stable AFM images of small-feature samples, a closed-loop. control cannot be used due to the large random errors of the sensor. The orthogonality of a new sample scanner having a motion guide is measured and corrected using a simple electronic circuit in open-loop scanning to reduce the scanner artifact. | - |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | INST PURE APPLIED PHYSICS | - |
dc.subject | TUBE SCANNERS | - |
dc.subject | PROBE | - |
dc.title | Orthogonality correction of planar sample scanner for atomic force microscope | - |
dc.type | Article | - |
dc.identifier.wosid | 000237571200008 | - |
dc.identifier.scopusid | 2-s2.0-33646479361 | - |
dc.type.rims | ART | - |
dc.citation.volume | 45 | - |
dc.citation.issue | 12-16 | - |
dc.citation.beginningpage | L370 | - |
dc.citation.endingpage | L372 | - |
dc.citation.publicationname | JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | - |
dc.identifier.doi | 10.1143/JJAP.45.L370 | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Gweon, Dae-Gab | - |
dc.contributor.nonIdAuthor | Lee, DY | - |
dc.contributor.nonIdAuthor | Lee, MY | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | planar scanner | - |
dc.subject.keywordAuthor | atomic force microscope | - |
dc.subject.keywordAuthor | coupling | - |
dc.subject.keywordAuthor | orthogonality | - |
dc.subject.keywordAuthor | open loop | - |
dc.subject.keywordPlus | TUBE SCANNERS | - |
dc.subject.keywordPlus | PROBE | - |
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