DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Dong-Yeon | ko |
dc.contributor.author | Gweon, Dae-Gab | ko |
dc.date.accessioned | 2010-02-08T07:22:57Z | - |
dc.date.available | 2010-02-08T07:22:57Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2009-01 | - |
dc.identifier.citation | INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.10, no.1, pp.119 - 121 | - |
dc.identifier.issn | 1229-8557 | - |
dc.identifier.uri | http://hdl.handle.net/10203/16504 | - |
dc.description.abstract | A tip-scanning atomic force microscope (AFM) can he used as a highly accurate height-measuring instrument for large samples, such as liquid crystal displays. To accurately measure the flatness or surface roughness of large samples, the xy-scanner-induced out-of-plane motion must he known to discriminate scanner artifacts from the measured AFM images. As the topographic signals of A FM measurements contain the hysteresis of the z-scanner piezoelectric actuators, actual movements of the z-scanner were measured using a z-axis sensor glued to the actuator. The actual out-of-plane motion of the xy-scanner was found to be less than 1 nm for a 50-mu m scan. | - |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | Korean Soc Precision Eng | - |
dc.subject | INTERFEROMETER | - |
dc.title | Accurate Measurement of the Out-of-plane Motion of a Tip-scanning Atomic Force Microscope | - |
dc.title.alternative | Accurate Measurement of the Out-of-plane Motion of a Tip-scanning Atomic Force Microscope | - |
dc.type | Article | - |
dc.identifier.wosid | 000262127100018 | - |
dc.identifier.scopusid | 2-s2.0-76849114171 | - |
dc.type.rims | ART | - |
dc.citation.volume | 10 | - |
dc.citation.issue | 1 | - |
dc.citation.beginningpage | 119 | - |
dc.citation.endingpage | 121 | - |
dc.citation.publicationname | INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING | - |
dc.identifier.doi | 10.1007/s12541-009-0018-z | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Gweon, Dae-Gab | - |
dc.contributor.nonIdAuthor | Lee, Dong-Yeon | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | Tip-scanning atomic force microscope | - |
dc.subject.keywordAuthor | Flexure-guided scanner | - |
dc.subject.keywordAuthor | Out-of-plane motion | - |
dc.subject.keywordAuthor | Hysteresis | - |
dc.subject.keywordPlus | INTERFEROMETER | - |
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