Control of wafer release in multi cluster tools

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dc.contributor.authorPark, Kyung Soo-
dc.contributor.authorMorrison J.R.-
dc.date.accessioned2013-03-28T09:28:53Z-
dc.date.available2013-03-28T09:28:53Z-
dc.date.created2012-02-06-
dc.date.issued2010-06-09-
dc.identifier.citation2010 8th IEEE International Conference on Control and Automation, ICCA 2010, v., no., pp.1481 - 1487-
dc.identifier.urihttp://hdl.handle.net/10203/164526-
dc.languageENG-
dc.titleControl of wafer release in multi cluster tools-
dc.typeConference-
dc.identifier.scopusid2-s2.0-77957862979-
dc.type.rimsCONF-
dc.citation.beginningpage1481-
dc.citation.endingpage1487-
dc.citation.publicationname2010 8th IEEE International Conference on Control and Automation, ICCA 2010-
dc.identifier.conferencecountryChina-
dc.identifier.conferencecountryChina-
dc.contributor.localauthorPark, Kyung Soo-
dc.contributor.nonIdAuthorMorrison J.R.-
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IE-Conference Papers(학술회의논문)
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