DC Field | Value | Language |
---|---|---|
dc.contributor.author | Ryu, B. | - |
dc.contributor.author | Choi, E.-A. | - |
dc.contributor.author | Noh, H.-K. | - |
dc.contributor.author | Bang, J. | - |
dc.contributor.author | Lee, W.-J. | - |
dc.contributor.author | Chang, Kee-Joo | - |
dc.date.accessioned | 2013-03-28T09:18:38Z | - |
dc.date.available | 2013-03-28T09:18:38Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2010 | - |
dc.identifier.citation | International Conference on Core Research and Engineering Science of Advanced Materials, v., no., pp. - | - |
dc.identifier.uri | http://hdl.handle.net/10203/164471 | - |
dc.language | ENG | - |
dc.title | Electronic Structure and Defects in Oxide Semiconductors and Insulators | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | International Conference on Core Research and Engineering Science of Advanced Materials | - |
dc.identifier.conferencecountry | Japan | - |
dc.identifier.conferencecountry | Japan | - |
dc.contributor.localauthor | Chang, Kee-Joo | - |
dc.contributor.nonIdAuthor | Ryu, B. | - |
dc.contributor.nonIdAuthor | Choi, E.-A. | - |
dc.contributor.nonIdAuthor | Noh, H.-K. | - |
dc.contributor.nonIdAuthor | Bang, J. | - |
dc.contributor.nonIdAuthor | Lee, W.-J. | - |
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