Self-reference extended depth-of-field quantitative phase microscopy
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Jang, J. | ko |
| dc.contributor.author | Bae, C.Y. | ko |
| dc.contributor.author | Park, J.-K. | ko |
| dc.contributor.author | Ye, Jong Chul | ko |
| dc.date.accessioned | 2013-03-28T09:02:46Z | - |
| dc.date.available | 2013-03-28T09:02:46Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2010-01-25 | - |
| dc.identifier.citation | Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII | - |
| dc.identifier.issn | 1605-7422 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/164346 | - |
| dc.language | English | - |
| dc.publisher | 123 | - |
| dc.title | Self-reference extended depth-of-field quantitative phase microscopy | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000284873500035 | - |
| dc.identifier.scopusid | 2-s2.0-77951864988 | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | San Francisco, CA | - |
| dc.contributor.localauthor | Ye, Jong Chul | - |
| dc.contributor.nonIdAuthor | Jang, J. | - |
| dc.contributor.nonIdAuthor | Bae, C.Y. | - |
| dc.contributor.nonIdAuthor | Park, J.-K. | - |
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