Grazing incidence X-ray analysis of ZnO thin films grown by atomic layer deposition
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Jong Yun | ko |
| dc.contributor.author | Park, Sang-Hee Ko | ko |
| dc.contributor.author | Jeong, Hu Young | ko |
| dc.contributor.author | Choi, Sung-Yool | ko |
| dc.contributor.author | Choi, J. Y. | ko |
| dc.contributor.author | Yoon, Tae Hyun | ko |
| dc.date.accessioned | 2013-03-28T07:37:44Z | - |
| dc.date.available | 2013-03-28T07:37:44Z | - |
| dc.date.created | 2012-12-01 | - |
| dc.date.created | 2012-12-01 | - |
| dc.date.created | 2012-12-01 | - |
| dc.date.issued | 2007-07-05 | - |
| dc.identifier.citation | International Conference on Materials for Advanced Technologies 2007 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/163882 | - |
| dc.language | English | - |
| dc.publisher | International Conference on Materials for Advanced Technologies 2007 | - |
| dc.title | Grazing incidence X-ray analysis of ZnO thin films grown by atomic layer deposition | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | International Conference on Materials for Advanced Technologies 2007 | - |
| dc.identifier.conferencecountry | SI | - |
| dc.identifier.conferencelocation | Suntec Singapore International Convention & Exhibition Centre | - |
| dc.contributor.localauthor | Choi, Sung-Yool | - |
| dc.contributor.nonIdAuthor | Kim, Jong Yun | - |
| dc.contributor.nonIdAuthor | Park, Sang-Hee Ko | - |
| dc.contributor.nonIdAuthor | Jeong, Hu Young | - |
| dc.contributor.nonIdAuthor | Choi, J. Y. | - |
| dc.contributor.nonIdAuthor | Yoon, Tae Hyun | - |
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