Low Noise Current Readout Circuit for Point-of-care Testing Application
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Choi, Yang-Kyu | - |
| dc.contributor.author | Im, Maesoon | - |
| dc.date.accessioned | 2013-03-27T06:12:27Z | - |
| dc.date.available | 2013-03-27T06:12:27Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2009-02 | - |
| dc.identifier.citation | The 16th Korean Conference on Semiconductors, v., no., pp.450 - 451 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/159834 | - |
| dc.language | KOR | - |
| dc.title | Low Noise Current Readout Circuit for Point-of-care Testing Application | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 450 | - |
| dc.citation.endingpage | 451 | - |
| dc.citation.publicationname | The 16th Korean Conference on Semiconductors | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | Choi, Yang-Kyu | - |
| dc.contributor.nonIdAuthor | Im, Maesoon | - |
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