DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Jeong Yong | - |
dc.date.accessioned | 2013-03-27T03:32:13Z | - |
dc.date.available | 2013-03-27T03:32:13Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2007-08-05 | - |
dc.identifier.citation | Microscopy and Microanalysis 2007 meeting, v., no., pp. - | - |
dc.identifier.uri | http://hdl.handle.net/10203/158680 | - |
dc.language | ENG | - |
dc.title | Microstructural analysis of RF-sputtered Ge-Bi-Te ternary chalcogenide alloy for phase change memory application | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | Microscopy and Microanalysis 2007 meeting | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Lee, Jeong Yong | - |
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