Microstructural Analysis of Sb-Se-Te Thin Films Crystallization by Using in Situ High Voltage Electron Microscopy
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Jeong Yong | - |
| dc.date.accessioned | 2013-03-27T03:00:05Z | - |
| dc.date.available | 2013-03-27T03:00:05Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2008-11-02 | - |
| dc.identifier.citation | The 9th Asia-Pacific Microscopy Conference, v., no., pp. - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/158483 | - |
| dc.language | ENG | - |
| dc.title | Microstructural Analysis of Sb-Se-Te Thin Films Crystallization by Using in Situ High Voltage Electron Microscopy | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | The 9th Asia-Pacific Microscopy Conference | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | Lee, Jeong Yong | - |
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