DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Jeong Yong | - |
dc.date.accessioned | 2013-03-27T02:59:32Z | - |
dc.date.available | 2013-03-27T02:59:32Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2008-04-24 | - |
dc.identifier.citation | 2008 Materials Research Society Spring Meeting, v., no., pp. - | - |
dc.identifier.uri | http://hdl.handle.net/10203/158479 | - |
dc.language | ENG | - |
dc.title | TEM study on The Crystallization and Phase transition Behavior of Annealed Ge-Bi-Te and Ge-Sn-Te Chalcogenide Thin Films for Phase Change Memory Material | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | 2008 Materials Research Society Spring Meeting | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Lee, Jeong Yong | - |
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