Analytical Transmission Electron Microscopy Study on the Oxygen Defect Formation of Ti Oxide Thin Films Sandwiched between Al Electrodes
- Issue Date
- 2007-04-09
- Language
- ENG
- Citation
2007 Materials Research Society Spring Meeting
- Appears in Collection
- MS-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.