DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Jeong Yong | - |
dc.date.accessioned | 2013-03-27T02:37:19Z | - |
dc.date.available | 2013-03-27T02:37:19Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2008-11-02 | - |
dc.identifier.citation | The 9th Asia-Pacific Microscopy Conference, v., no., pp. - | - |
dc.identifier.uri | http://hdl.handle.net/10203/158344 | - |
dc.language | ENG | - |
dc.title | Microstructural Analysis of In Doped Ge-Sb-Te Thin Films using High Voltage Electron Microscopy | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | The 9th Asia-Pacific Microscopy Conference | - |
dc.identifier.conferencecountry | South Korea | - |
dc.identifier.conferencecountry | South Korea | - |
dc.contributor.localauthor | Lee, Jeong Yong | - |
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