Definition and extraction of causal relations for QA on fault diagnosis of devices
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee S.-M. | - |
| dc.contributor.author | Shin J.-A. | - |
| dc.date.accessioned | 2013-03-27T01:17:10Z | - |
| dc.date.available | 2013-03-27T01:17:10Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2008-11-03 | - |
| dc.identifier.citation | 20th IEEE International Conference on Tools with Artificial Intelligence, ICTAI'08, v., no., pp.82 - 88 | - |
| dc.identifier.issn | 1082-3409 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/157798 | - |
| dc.language | ENG | - |
| dc.title | Definition and extraction of causal relations for QA on fault diagnosis of devices | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-57649224065 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 82 | - |
| dc.citation.endingpage | 88 | - |
| dc.citation.publicationname | 20th IEEE International Conference on Tools with Artificial Intelligence, ICTAI'08 | - |
| dc.contributor.localauthor | Shin J.-A. | - |
| dc.contributor.nonIdAuthor | Lee S.-M. | - |
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