An electrical particle velocity profiler for in-channel clogging detection and flow pattern characterization

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dc.contributor.authorKim, TY-
dc.contributor.authorCho, Young-Ho-
dc.date.accessioned2013-03-25T23:58:54Z-
dc.date.available2013-03-25T23:58:54Z-
dc.date.created2012-02-06-
dc.date.issued2007-06-10-
dc.identifier.citation4th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS and EUROSENSORS '07, v., no., pp.775 - 778-
dc.identifier.urihttp://hdl.handle.net/10203/156226-
dc.languageENG-
dc.titleAn electrical particle velocity profiler for in-channel clogging detection and flow pattern characterization-
dc.typeConference-
dc.identifier.scopusid2-s2.0-50049102954-
dc.type.rimsCONF-
dc.citation.beginningpage775-
dc.citation.endingpage778-
dc.citation.publicationname4th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS and EUROSENSORS '07-
dc.identifier.conferencecountryFrance-
dc.identifier.conferencecountryFrance-
dc.contributor.localauthorCho, Young-Ho-
dc.contributor.nonIdAuthorKim, TY-
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BiS-Conference Papers(학술회의논문)
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