DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jee, YK | - |
dc.contributor.author | Xia, YH | - |
dc.contributor.author | Yu, Jin | - |
dc.contributor.author | Kang, HW | - |
dc.contributor.author | Lee, TY | - |
dc.date.accessioned | 2013-03-25T23:54:46Z | - |
dc.date.available | 2013-03-25T23:54:46Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2008-05-27 | - |
dc.identifier.citation | 58th Electronic Components and Technology Conference, ECTC 2008, v., no., pp.491 - 494 | - |
dc.identifier.issn | 0569-5503 | - |
dc.identifier.uri | http://hdl.handle.net/10203/156208 | - |
dc.language | ENG | - |
dc.title | Effect of Al addition in Sn-Ag solder on the interfacial reactions with Cu and ENIG metallizations | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-51349095281 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 491 | - |
dc.citation.endingpage | 494 | - |
dc.citation.publicationname | 58th Electronic Components and Technology Conference, ECTC 2008 | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Yu, Jin | - |
dc.contributor.nonIdAuthor | Jee, YK | - |
dc.contributor.nonIdAuthor | Xia, YH | - |
dc.contributor.nonIdAuthor | Kang, HW | - |
dc.contributor.nonIdAuthor | Lee, TY | - |
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