Nanoscale coupling effects on single particle microscopy
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Shuford, K.L. | - |
| dc.contributor.author | Meyer, K.A. | - |
| dc.contributor.author | Li, C. | - |
| dc.contributor.author | Cho, Sung Oh | - |
| dc.contributor.author | Whitten, W.B. | - |
| dc.contributor.author | Shaw, R.W. | - |
| dc.date.accessioned | 2013-03-19T04:58:22Z | - |
| dc.date.available | 2013-03-19T04:58:22Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2008-08-10 | - |
| dc.identifier.citation | Plasmonics: Nanoimaging, Nanofabrication, and Their Applications IV, v., no., pp. - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/155941 | - |
| dc.language | ENG | - |
| dc.title | Nanoscale coupling effects on single particle microscopy | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-56249099715 | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | Plasmonics: Nanoimaging, Nanofabrication, and Their Applications IV | - |
| dc.identifier.conferencecountry | United States | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Cho, Sung Oh | - |
| dc.contributor.nonIdAuthor | Shuford, K.L. | - |
| dc.contributor.nonIdAuthor | Meyer, K.A. | - |
| dc.contributor.nonIdAuthor | Li, C. | - |
| dc.contributor.nonIdAuthor | Whitten, W.B. | - |
| dc.contributor.nonIdAuthor | Shaw, R.W. | - |
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