Self-retention of data in power-gated circuits
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Seomun, J. | ko |
| dc.contributor.author | Shin, Youngsoo | ko |
| dc.date.accessioned | 2013-03-19T01:27:06Z | - |
| dc.date.available | 2013-03-19T01:27:06Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2009-11-22 | - |
| dc.identifier.citation | 2009 International SoC Design Conference, ISOCC 2009, pp.212 - 215 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/154472 | - |
| dc.language | English | - |
| dc.publisher | 123 | - |
| dc.title | Self-retention of data in power-gated circuits | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000290246700053 | - |
| dc.identifier.scopusid | 2-s2.0-77951465193 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 212 | - |
| dc.citation.endingpage | 215 | - |
| dc.citation.publicationname | 2009 International SoC Design Conference, ISOCC 2009 | - |
| dc.identifier.conferencecountry | KO | - |
| dc.identifier.conferencelocation | Busan | - |
| dc.contributor.localauthor | Shin, Youngsoo | - |
| dc.contributor.nonIdAuthor | Seomun, J. | - |
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