A Comprehensive Study of Hot-Carrier Effects in Body-Tied FinFETs

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dc.contributor.authorChoi, Yang-Kyu-
dc.contributor.authorHan, Jin-Woo-
dc.contributor.authorLee, Choong-Ho-
dc.contributor.authorPark, Donggun-
dc.date.accessioned2013-03-18T22:46:27Z-
dc.date.available2013-03-18T22:46:27Z-
dc.date.created2012-02-06-
dc.date.issued2005-09-
dc.identifier.citation2005 International Conference on Solid State Devices and Materials Proceedings, v., no., pp.876 - 877-
dc.identifier.urihttp://hdl.handle.net/10203/153258-
dc.languageENG-
dc.titleA Comprehensive Study of Hot-Carrier Effects in Body-Tied FinFETs-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage876-
dc.citation.endingpage877-
dc.citation.publicationname2005 International Conference on Solid State Devices and Materials Proceedings-
dc.identifier.conferencecountryJapan-
dc.identifier.conferencecountryJapan-
dc.contributor.localauthorChoi, Yang-Kyu-
dc.contributor.nonIdAuthorHan, Jin-Woo-
dc.contributor.nonIdAuthorLee, Choong-Ho-
dc.contributor.nonIdAuthorPark, Donggun-
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EE-Conference Papers(학술회의논문)
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