Threshold analysis of a sequential detection scheme with locally optimum test statistic
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Choi, S.W. | - |
| dc.contributor.author | Lee, J. | - |
| dc.contributor.author | Kwon, H. | - |
| dc.contributor.author | Park, S.R. | - |
| dc.contributor.author | Song, Iickho | - |
| dc.date.accessioned | 2013-03-18T19:36:15Z | - |
| dc.date.available | 2013-03-18T19:36:15Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2005-11 | - |
| dc.identifier.citation | Fall Confer. Inst. EEK, v., no., pp.217 - 220 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/151759 | - |
| dc.language | KOR | - |
| dc.publisher | 대한전자공학회 | - |
| dc.title | Threshold analysis of a sequential detection scheme with locally optimum test statistic | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 217 | - |
| dc.citation.endingpage | 220 | - |
| dc.citation.publicationname | Fall Confer. Inst. EEK | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | Song, Iickho | - |
| dc.contributor.nonIdAuthor | Choi, S.W. | - |
| dc.contributor.nonIdAuthor | Lee, J. | - |
| dc.contributor.nonIdAuthor | Kwon, H. | - |
| dc.contributor.nonIdAuthor | Park, S.R. | - |
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