Characterization of LO leakage behavior in Transconductance Mixers
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Sang-Gug | - |
| dc.date.accessioned | 2013-03-18T17:42:41Z | - |
| dc.date.available | 2013-03-18T17:42:41Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2005-12-01 | - |
| dc.identifier.citation | 2005 IEEE International Conference on Electron Devices and Solid-State Circuits, v.0, no.0, pp.19 - 21 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/150841 | - |
| dc.language | ENG | - |
| dc.publisher | 2005 IEEE International Conference on Electron Devices and Solid-State Circuits | - |
| dc.title | Characterization of LO leakage behavior in Transconductance Mixers | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.volume | 0 | - |
| dc.citation.issue | 0 | - |
| dc.citation.beginningpage | 19 | - |
| dc.citation.endingpage | 21 | - |
| dc.citation.publicationname | 2005 IEEE International Conference on Electron Devices and Solid-State Circuits | - |
| dc.contributor.localauthor | Lee, Sang-Gug | - |
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