DC Field | Value | Language |
---|---|---|
dc.contributor.author | Seo, J | - |
dc.contributor.author | Lim, Koeng Su | - |
dc.date.accessioned | 2013-03-18T16:32:44Z | - |
dc.date.available | 2013-03-18T16:32:44Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2006 | - |
dc.identifier.citation | International Conference on Nanoscience and Technology, v., no., pp.1434 - | - |
dc.identifier.uri | http://hdl.handle.net/10203/150245 | - |
dc.language | ENG | - |
dc.title | Measuremet and Analysis of the Conducting Filament in Al/p-a-Si:H/Al Thin Film Device and its Switching Properties | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 1434 | - |
dc.citation.publicationname | International Conference on Nanoscience and Technology | - |
dc.identifier.conferencecountry | Switzerland | - |
dc.identifier.conferencecountry | Switzerland | - |
dc.contributor.localauthor | Lim, Koeng Su | - |
dc.contributor.nonIdAuthor | Seo, J | - |
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