Browse "Dept. of Industrial and Systems Engineering(산업및시스템공학과)" by Title
Showing results 3921 to 3940 of 5974
| Semi-Automatic Quality Assessment of Linked Data without Requiring Ontology Jang, Sae Mi; Choi, Ji Yeon; Yi, Mun Yong, International Semantic Web Conference (ISWC) NLPDBpedia, Semantic Web Science Association, 2015-10-12 |
| Semi-supervised bearing fault diagnosis with adversarially trained phase-consistent network = 적대적 위상 일치 신경망을 사용한 준지도 베어링 이상 진단link Yi, Jaehyuk; Park, Jinkyoo; et al, 한국과학기술원, 2021 |
| Semi-supervised Bearing Fault Diagnosis with Adversarially-Trained Phase-Consistent Network Yi, Jaehyuk; Park, Jinkyoo, 27th ACM SIGKDD Conference on Knowledge Discovery and Data Mining, KDD 2021, pp.3875 - 3885, Association for Computing Machinery, 2021-08 |
| Semi-supervised learning for simultaneous location detection and classification of mixed-type defect patterns in wafer bin maps = 웨이퍼 혼합 결함 패턴의 위치 탐지와 분류를 위한 준지도 학습link Lee, Jaehyun; Kim, Heeyoung; et al, 한국과학기술원, 2022 |
| Semi-Supervised Learning for Simultaneous Location Detection and Classification of Mixed-Type Defect Patterns in Wafer Bin Maps Lee, Hyuck; Lee, Jaehyun; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.36, no.2, pp.220 - 230, 2023-05 |
| Semi-Supervised Multi-Label Learning for Classification of Wafer Bin Maps With Mixed-Type Defect Patterns Lee, Hyuck; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.653 - 662, 2020-11 |
| Semi-supervised multi-label learning for classification of wafer bin maps with mixed-type defect patterns = 준지도 다중 라벨 학습을 이용한 혼합된 형태의 결함 패턴을 가진 반도체 웨이퍼 빈맵 분류link Lee, Hyuck; Kim, Heeyoung; et al, 한국과학기술원, 2020 |
| Semiconductor Equipment Health Monitoring with Multi-View Data Ahn, Jeongsun; Kim, Hong Yeon; Cho, Sanghyun; Kim, Hongyeon; Choi, Hyeonjeong; Ham, Dain; Kim, Hyunjung, 2023 Winter Simulation Conference, INFORMS, 2023-12-13 |
| Semiconductor FAB layout design analysis with 300-mm FAB data: "Is minimum distance-based layout design best for semiconductor FAB design?" Kim, Junghoon; Yu, Gwangjae; Jang, Young Jae, COMPUTERS INDUSTRIAL ENGINEERING, v.99, pp.330 - 346, 2016-09 |
| Semiconductor FAB OHT track analysis using queueing network model = 큐잉 네트워크 모델을 이용한 반도체 팹 OHT 트랙 분석link Kim, Junghoon; Jang, Young Jae; et al, 한국과학기술원, 2018 |
| Semiconductor manufacturing intelligence and automation Foreward Chien, Chen-Fu; Hsu, Chia-Yu; Morrison, James R; Dou, Runliang, COMPUTERS & INDUSTRIAL ENGINEERING, v.99, pp.315 - 317, 2016-09 |
| Sensitivity estimates for compound sums Glasserman, P.; Kim, Kyoung-Kuk, Eighth International Conference on Monte Carlo and Quasi-Monte Carlo Methods in Scientific Computing , 2008-07-08 |
| Sensitivity of wardrop equilibria: revisited Takalloo, Mahdi; Kwon, Changhyun, OPTIMIZATION LETTERS, v.14, no.3, pp.781 - 796, 2020-04 |
| Sensors Know Which Photos Are Memorable Kim, Soyoung; Kalenzi Asio Evelyn Patra; Kim, Auk; Lee, Kun-Pyo; Segev, Aviv; Lee, Uichin, 2017 ACM SIGCHI Conference on Human Factors in Computing Systems, CHI EA 2017, pp.2706 - 2713, ACM Special Interest Group on Computer-Human Interaction (SIGCHI), 2017-05-06 |
| Sentential Paraphrase Generation for Agglutinative Languages Using SVM with a String Kernel Park, Hancheol; Gweon, Gahgene; Choi, Ho-Jin; Heo, Jeong; Ryu, Pum-Mo, The 28th Pacific Asia Conference on Language, Information and Computing (PACLIC 28), Chulalongkorn University, Language and Semantic Technology Laboratory, National Electronics and Computer Technology Center (NECTEC), Sirindhorn International Institute of Technology (SIIT), 2014-12-14 |
| Sequence-order-independent network profiling for detecting application layer DDoS attacks Lee, Sang-Jae; Kim, Gi-Sung; Kim, Se-Hun, EURASIP JOURNAL ON WIRELESS COMMUNICATIONS AND NETWORKING, v.2011, no.50, 2011-08 |
| Sequencing delivery and receiving operations for yard cranes in port container terminals Kim, Kap-Hwan; Lee, Keung-Mo; Hwang, Hark, INTERNATIONAL JOURNAL OF PRODUCTION ECONOMICS, v.84, no.3, pp.283 - 292, 2003-06 |
| Sequencing for a Mixed Model Assembly Line in Just-In-Time Production System 황학, KOREAN MANAGEMENT SCIENCE REVIEW, v.11, no.1, 1994-01 |
| Sequencing for a mixed-model assembly line in JIT system = JIT 생산체계를 취하는 다품종 조립라인에서의 작업물 투입 순서 결정에 관한 연구link Jeong, In-Jae; 정인재; et al, 한국과학기술원, 1994 |
| SEQUENCING PICKING OPERATIONS AND TRAVEL TIME MODELS FOR MAN-ON-BOARD STORAGE AND RETRIEVAL WAREHOUSING SYSTEM Hwang, Hark; jin-young song, INTERNATIONAL JOURNAL OF PRODUCTION ECONOMICS, v.29, no.1, pp.75 - 88, 1993 |
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