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A dual burn-in policy for defect-tolerant memory products using the number of repairs as a quality indicator Tong, SH; Yum, Bong-Jin, MICROELECTRONICS RELIABILITY, v.48, pp.471 - 480, 2008-03 |
Prediction of highly imbalanced semiconductor chip-level defects using uncertainty-based adaptive margin learning Park, Sumin; Kim, Keunseo; Kim, Heeyoung, IISE TRANSACTIONS, v.55, no.2, pp.147 - 155, 2022-11 |
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