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Development of a dual burn-in policy for semiconductor products based on the number of defective neighborhood chips Tong S.H.; Yum, Bong-Jin, INTERNATIONAL JOURNAL OF RELIABILITY, QUALITY AND SAFETY ENGINEERING, v.13, no.6, pp.501 - 525, 2006-12 |
Scheduling Algorithms for Minimizing Tardiness of Orders at the Burn-in Workstation in a Semiconductor Manufacturing System Kim, Yeong-Dae; Kang, Jae-Hun; Lee, Gyeong-Eun; Lim, Seung-Kil, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.24, no.1, pp.14 - 26, 2011-02 |
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