Browse "Dept. of Industrial and Systems Engineering(산업및시스템공학과)" by Subject convolutional neural network▼aaugmented memory▼adefect pattern classification▼aclass imbalance▼awafer bin map▼asemiconductor manufacturing
Showing results 1 to 1 of 1
| Memory-augmented convolutional neural networks with triplet loss for imbalanced wafer defect pattern classification = 메모리가 결합된 합성곱 신경망을 이용한 불균형 웨이퍼 결함 패턴 분류link Hyun, Yunseung; Kim, Heeyoung; et al, 한국과학기술원, 2020 |
Discover
Open Access
Date issued
- 593 2020 - 2024
- 1,944 2010 - 2019
- 1,604 2000 - 2009
- 1,156 1990 - 1999
- 507 1980 - 1989