Browse "Dept. of Industrial and Systems Engineering(산업및시스템공학과)" by Subject 베타 혼합 모델▼a합성곱 신경망▼a심층 학습▼a라벨 노이즈▼a웨이퍼 빈 맵
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| Noisy label correction for classification of wafer bin maps with mixed-type defect patterns = 웨이퍼 결함 패턴 분류를 위한 라벨 노이즈에 강건한 심층 학습법 연구link Kim, Sumin; Kim, Heeyoung; et al, 한국과학기술원, 2021 |
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