Browse "Dept. of Industrial and Systems Engineering(산업및시스템공학과)" by Title
Showing results 4001 to 4020 of 6097
| Self-healing ring 구조의 광 통신망 설계 = Design of an optical network in self-healing ring structurelink 이성준; Lee, Sung-Jun; et al, 한국과학기술원, 2000 |
| Self-intersection removal in triangular mesh offseting Jung, WH; Jeong, CS; Shin, Hayong; Choi, Byoung Kyu, International Journal of CAD/CAM Workshop on Digital Engineering, pp.3 - 15, IJCC, 2003 |
| Self-intersection removal in triangular mesh offsetting Choi, Byoung Kyu; Shin, Hayong; Jung, Wonhyung, Computer-Aided Design and Applications, '04 conference, pp.0 - 0, 2004-05 |
| Self-intersection removal in triangular mesh offsetting Choi, Byoung Kyu; Jung, Wonhyung; Shin, Hayong, SCCE International Symposium, pp.0 - 0, SCCE, 2003-08 |
| Self-intersection removal in triangular mesh offsetting Jung, W; Shin, Hayong; Choi, B.K, COMPUTER-AIDED DESIGN AND APPLICATIONS, v.1, no.1-4, pp.477 - 484, 2004 |
| Self-organizing social and spatial networks under what-if scenarios Moon, Il-Chul; Carley, Kathleen M., 6th International Joint Conference on Autonomous Agents and Multiagent Systems, AAMAS'07, pp.1353 - 1360, International Foundation for Autonomous Agents and Multiagent Systems (IFAAMAS), 2007-05-14 |
| Self-supervised graph representation learning via positive mining Lee, Namkyeong; Lee, Junseok; Park, Chanyoung, INFORMATION SCIENCES, v.611, pp.476 - 493, 2022-09 |
| Semantic mapping based on ontology and a bayesian network and its application to CAD and PDM integration Lee, MJ; Jung, M; Suh, Hyo-Won, 2006 ASME International Design Engineering Technical Conferences and Computers and Information In Engineering Conference, DETC2006, 2006-09-10 |
| Semantic Mapping Based on ontology and a bayesian network for a collaborative engineering environment including CAD and PDM integration Lee, Min-Jung; Jung, Min; Suh, Hyo-Won, Proceedings of ASME, International Design Engineering Technical Conferences, Computers and Information in Engineering Conference IDETC/CIE, ASME, 2006-09 |
| Semantic Mapping Using Ontology Inferencing for Collaborative Product Commerce Environment Jung, Woncheol; Lee, JaeHyun; Suh, Hyo-Won, Proceedings of the 10th Asia Pacific Management Conference, pp.817 - 830, 2004-10-27 |
| Semantic Methods for Service Categorization - An Empirical Study Gal, A; Segev, Aviv; Toch, E, Proceedings of VLDB International Workshop on Semantic Data and Service Integration (SDSI’07) , ., 2007-09-23 |
| Semantic relation based personalized ranking approach for engineering document retrieval Hahm, Gyeong June; Lee, Jae Hyun; Suh, Hyo Won, ADVANCED ENGINEERING INFORMATICS, v.29, no.3, pp.366 - 379, 2015-08 |
| Semi-automatic generation of knowledge graph by masked language model and improved skip-gramlink Yun, Byung-Il; Suh, Hyo-Won; et al, 2021 |
| Semi-Automatic Quality Assessment of Linked Data without Requiring Ontology Jang, Sae Mi; Choi, Ji Yeon; Yi, Mun Yong, International Semantic Web Conference (ISWC) NLPDBpedia, Semantic Web Science Association, 2015-10-12 |
| Semi-supervised bearing fault diagnosis with adversarially trained phase-consistent network = 적대적 위상 일치 신경망을 사용한 준지도 베어링 이상 진단link Yi, Jaehyuk; Park, Jinkyoo; et al, 한국과학기술원, 2021 |
| Semi-supervised Bearing Fault Diagnosis with Adversarially-Trained Phase-Consistent Network Yi, Jaehyuk; Park, Jinkyoo, 27th ACM SIGKDD Conference on Knowledge Discovery and Data Mining, KDD 2021, pp.3875 - 3885, Association for Computing Machinery, 2021-08 |
| Semi-supervised learning for simultaneous location detection and classification of mixed-type defect patterns in wafer bin maps = 웨이퍼 혼합 결함 패턴의 위치 탐지와 분류를 위한 준지도 학습link Lee, Jaehyun; Kim, Heeyoung; et al, 한국과학기술원, 2022 |
| Semi-Supervised Learning for Simultaneous Location Detection and Classification of Mixed-Type Defect Patterns in Wafer Bin Maps Lee, Hyuck; Lee, Jaehyun; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.36, no.2, pp.220 - 230, 2023-05 |
| Semi-Supervised Multi-Label Learning for Classification of Wafer Bin Maps With Mixed-Type Defect Patterns Lee, Hyuck; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.653 - 662, 2020-11 |
| Semi-supervised multi-label learning for classification of wafer bin maps with mixed-type defect patterns = 준지도 다중 라벨 학습을 이용한 혼합된 형태의 결함 패턴을 가진 반도체 웨이퍼 빈맵 분류link Lee, Hyuck; Kim, Heeyoung; et al, 한국과학기술원, 2020 |
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