The Electrical, Optical and Structural Characteristics of N-type Microcrystalline Silicon Thin Films Deposited by TCP-CVD
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lim, Koeng Su | - |
| dc.contributor.author | Lee, YJ | - |
| dc.contributor.author | Shin, JK | - |
| dc.date.accessioned | 2013-03-18T15:06:35Z | - |
| dc.date.available | 2013-03-18T15:06:35Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2005 | - |
| dc.identifier.citation | 15th PVSEC, v., no., pp.1138 - 1139 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/149555 | - |
| dc.language | ENG | - |
| dc.title | The Electrical, Optical and Structural Characteristics of N-type Microcrystalline Silicon Thin Films Deposited by TCP-CVD | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 1138 | - |
| dc.citation.endingpage | 1139 | - |
| dc.citation.publicationname | 15th PVSEC | - |
| dc.identifier.conferencecountry | China | - |
| dc.identifier.conferencecountry | China | - |
| dc.contributor.localauthor | Lim, Koeng Su | - |
| dc.contributor.nonIdAuthor | Lee, YJ | - |
| dc.contributor.nonIdAuthor | Shin, JK | - |
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