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College of Engineering(공과대학)Dept. of Materials Science and Engineering(신소재공학과)MS-Conference Papers(학술회의논문)

Effect of bit size dependence on the grain size in ferroelectric thin films using piezoelectric force microscopy

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dc.contributor.authorNo, Kwangsoo-
dc.contributor.authorKim, Yun Seok-
dc.contributor.authorHong, Seung Bum-
dc.contributor.authorPark, Hong Sik-
dc.contributor.authorMin, Dong Ki-
dc.date.accessioned2013-03-18T13:57:10Z-
dc.date.available2013-03-18T13:57:10Z-
dc.date.created2012-02-06-
dc.date.issued2004-10-14-
dc.identifier.citationSeeing at the Nanoscale conference II, v.0, no.0, pp.0 - 0-
dc.identifier.urihttp://hdl.handle.net/10203/149044-
dc.languageENG-
dc.titleEffect of bit size dependence on the grain size in ferroelectric thin films using piezoelectric force microscopy-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.volume0-
dc.citation.issue0-
dc.citation.beginningpage0-
dc.citation.endingpage0-
dc.citation.publicationnameSeeing at the Nanoscale conference II-
dc.identifier.conferencecountryFrance-
dc.identifier.conferencecountryFrance-
dc.contributor.localauthorNo, Kwangsoo-
dc.contributor.nonIdAuthorKim, Yun Seok-
dc.contributor.nonIdAuthorHong, Seung Bum-
dc.contributor.nonIdAuthorPark, Hong Sik-
dc.contributor.nonIdAuthorMin, Dong Ki-
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MS-Conference Papers(학술회의논문)
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