DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kyung, Chong-Min | - |
dc.contributor.author | Yang, Wooseung | - |
dc.contributor.author | Chung, Moo-Kyeong | - |
dc.date.accessioned | 2013-03-18T12:33:24Z | - |
dc.date.available | 2013-03-18T12:33:24Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2003-09 | - |
dc.identifier.citation | IEEE International SOC Conference, v., no., pp.213 - 216 | - |
dc.identifier.uri | http://hdl.handle.net/10203/148394 | - |
dc.language | ENG | - |
dc.title | Current Status and Challenges of SoC Verification for Embedded Systems Market | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 213 | - |
dc.citation.endingpage | 216 | - |
dc.citation.publicationname | IEEE International SOC Conference | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Kyung, Chong-Min | - |
dc.contributor.nonIdAuthor | Yang, Wooseung | - |
dc.contributor.nonIdAuthor | Chung, Moo-Kyeong | - |
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