Evaluation of retention loss phenomena in heteroepitaxial PbTiO3 thin films with single c-domain structure fabricated at low temperature for SPM-based data storage application

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dc.contributor.authorChoi, Si-Kyung-
dc.contributor.authorAhn, WS-
dc.contributor.authorJung, WW-
dc.date.accessioned2013-03-18T11:58:54Z-
dc.date.available2013-03-18T11:58:54Z-
dc.date.created2012-02-06-
dc.date.issued2004-
dc.identifier.citationThe 2nd Student-Organizing International Mini-Conference on Information Electronics System, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/148182-
dc.languageENG-
dc.titleEvaluation of retention loss phenomena in heteroepitaxial PbTiO3 thin films with single c-domain structure fabricated at low temperature for SPM-based data storage application-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameThe 2nd Student-Organizing International Mini-Conference on Information Electronics System-
dc.identifier.conferencecountryJapan-
dc.identifier.conferencecountryJapan-
dc.contributor.localauthorChoi, Si-Kyung-
dc.contributor.nonIdAuthorAhn, WS-
dc.contributor.nonIdAuthorJung, WW-
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MS-Conference Papers(학술회의논문)
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