ESR Studies of Defects in Intrinsic and Boron-Doped Hydrogenated nc-SiC:H Films Prepared by Photo-CVD
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lim, Koeng Su | - |
| dc.contributor.author | Shevaleevskiy, O | - |
| dc.contributor.author | Myong, SY | - |
| dc.date.accessioned | 2013-03-18T11:10:38Z | - |
| dc.date.available | 2013-03-18T11:10:38Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2005 | - |
| dc.identifier.citation | ICANS21, v., no., pp. - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/147770 | - |
| dc.language | ENG | - |
| dc.title | ESR Studies of Defects in Intrinsic and Boron-Doped Hydrogenated nc-SiC:H Films Prepared by Photo-CVD | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | ICANS21 | - |
| dc.identifier.conferencecountry | Portugal | - |
| dc.identifier.conferencecountry | Portugal | - |
| dc.contributor.localauthor | Lim, Koeng Su | - |
| dc.contributor.nonIdAuthor | Shevaleevskiy, O | - |
| dc.contributor.nonIdAuthor | Myong, SY | - |
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