DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jeon, H. | - |
dc.contributor.author | Cho, Gyuseong | - |
dc.contributor.author | Chi, Y.K. | - |
dc.contributor.author | Chung, M.J. | - |
dc.contributor.author | Kim, K.H. | - |
dc.date.accessioned | 2013-03-18T00:23:28Z | - |
dc.date.available | 2013-03-18T00:23:28Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2006-10-29 | - |
dc.identifier.citation | 2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD, v., no., pp.1960 - 1963 | - |
dc.identifier.issn | 1095-7863 | - |
dc.identifier.uri | http://hdl.handle.net/10203/143162 | - |
dc.language | ENG | - |
dc.title | An experimental study on the variation of MTF and NPS caused by x-ray beam conditions for three indirect digital radiographic imagers | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-38649126939 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 1960 | - |
dc.citation.endingpage | 1963 | - |
dc.citation.publicationname | 2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Cho, Gyuseong | - |
dc.contributor.nonIdAuthor | Jeon, H. | - |
dc.contributor.nonIdAuthor | Chi, Y.K. | - |
dc.contributor.nonIdAuthor | Chung, M.J. | - |
dc.contributor.nonIdAuthor | Kim, K.H. | - |
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