Protein quantification on dendrimer-activated surfaces by using time-of-flight secondary ion mass spectrometry and principal component regression

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dc.contributor.authorKim, Young-Pilko
dc.contributor.authorHong, Mi-Youngko
dc.contributor.authorShon, Hyun Kyongko
dc.contributor.authorChegal, Wonko
dc.contributor.authorCho, Hyun Moko
dc.contributor.authorMoon, Dae Wonko
dc.contributor.authorKim, Hak-Sungko
dc.contributor.authorLee, Tae Geolko
dc.date.accessioned2009-12-07T03:05:13Z-
dc.date.available2009-12-07T03:05:13Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2008-12-
dc.identifier.citationAPPLIED SURFACE SCIENCE, v.255, no.4, pp.1110 - 1112-
dc.identifier.issn0169-4332-
dc.identifier.urihttp://hdl.handle.net/10203/14273-
dc.description.abstractInteraction between streptavidin and biotin on poly(amidoamine) (PAMAM) dendrimer-activated surfaces and on self-assembled monolayers (SAMs) was quantitatively studied by using time-of-flight secondary ion mass spectrometry (ToF-SIMS). The surface protein density was systematically varied as a function of protein concentration and independently quantified using the ellipsometry technique. Principal component analysis (PCA) and principal component regression (PCR) were used to identify a correlation between the intensities of the secondary ion peaks and the surface protein densities. From the ToF-SIMS and ellipsometry results, a good linear correlation of protein density was found. Our study shows that surface protein densities are higher on dendrimer-activated surfaces than on SAMs surfaces due to the spherical property of the dendrimer, and that these surface protein densities can be easily quantified with high sensitivity in a label-free manner by ToF-SIMS. (c) 2008 Elsevier B.V. All rights reserved.-
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherELSEVIER SCIENCE BV-
dc.subjectTOF-SIMS-
dc.subjectQUANTITATIVE-ANALYSIS-
dc.subjectLIGAND INTERACTIONS-
dc.subjectMONOLAYERS-
dc.titleProtein quantification on dendrimer-activated surfaces by using time-of-flight secondary ion mass spectrometry and principal component regression-
dc.typeArticle-
dc.identifier.wosid000261259400082-
dc.identifier.scopusid2-s2.0-56449131621-
dc.type.rimsART-
dc.citation.volume255-
dc.citation.issue4-
dc.citation.beginningpage1110-
dc.citation.endingpage1112-
dc.citation.publicationnameAPPLIED SURFACE SCIENCE-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorKim, Hak-Sung-
dc.contributor.nonIdAuthorShon, Hyun Kyong-
dc.contributor.nonIdAuthorChegal, Won-
dc.contributor.nonIdAuthorCho, Hyun Mo-
dc.contributor.nonIdAuthorMoon, Dae Won-
dc.contributor.nonIdAuthorLee, Tae Geol-
dc.type.journalArticleArticle; Proceedings Paper-
dc.subject.keywordAuthorQuantification-
dc.subject.keywordAuthorDendrimer-
dc.subject.keywordAuthorSAM-
dc.subject.keywordAuthorStreptavidin-
dc.subject.keywordAuthorToF-SIMS-
dc.subject.keywordAuthorEllipsometry-
dc.subject.keywordAuthorPCA-
dc.subject.keywordPlusTOF-SIMS-
dc.subject.keywordPlusQUANTITATIVE-ANALYSIS-
dc.subject.keywordPlusLIGAND INTERACTIONS-
dc.subject.keywordPlusMONOLAYERS-
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