We investigate the fractal behavior of magnetic domain together with analysis of dynamic reversal behavior in Co/Pd multilayer films prepared with different number of repeats n. We utilize a novel magneto-optical microscope magnetometer technique to visualize the time-resolved domain evolution patterns in these films. Quantitative analysis of the time-resolved domain evolution patterns allows us to determine the fractal dimension D-f and the reversal ratio V/R depending on n, where V/R represents the counterbalance between the wall-motion speed V and the nucleation rate R. As n increases, domain shape becomes more ragged and complex and thus, D-f increases. Interestingly enough, the change in D-f clearly seems to be coupled to the change in V/R with varying n, which implies that the correlation between Df and V/R is mediated via the distributed defects. (C) 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.