Cell deformability monitoring chips based on orifice-length-dependent digital lysis rates
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Youn, S | - |
| dc.contributor.author | Lee, DW | - |
| dc.contributor.author | Cho, Young-Ho | - |
| dc.date.accessioned | 2013-03-17T05:40:16Z | - |
| dc.date.available | 2013-03-17T05:40:16Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2006-01-22 | - |
| dc.identifier.citation | 19th IEEE International Conference on Micro Electro Mechanical Systems, v., no., pp.16 - 19 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/140336 | - |
| dc.language | ENG | - |
| dc.title | Cell deformability monitoring chips based on orifice-length-dependent digital lysis rates | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-33750122592 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 16 | - |
| dc.citation.endingpage | 19 | - |
| dc.citation.publicationname | 19th IEEE International Conference on Micro Electro Mechanical Systems | - |
| dc.identifier.conferencecountry | Turkey | - |
| dc.identifier.conferencecountry | Turkey | - |
| dc.contributor.localauthor | Cho, Young-Ho | - |
| dc.contributor.nonIdAuthor | Youn, S | - |
| dc.contributor.nonIdAuthor | Lee, DW | - |
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