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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

Design Comparison of I/O Port Ground and Power Plane for Enhanced ESD Immunity

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dc.contributor.authorKim, Joungho-
dc.contributor.authorLee, Junho-
dc.contributor.authorKim, Tae Hong-
dc.contributor.authorKim, Hyungsoo-
dc.contributor.authorRyu, Woonghwan-
dc.contributor.authorChoi, Jae Chun-
dc.date.accessioned2013-03-16T21:53:38Z-
dc.date.available2013-03-16T21:53:38Z-
dc.date.created2012-02-06-
dc.date.issued2002-
dc.identifier.citationEMC Europe 2002 International Symposium on Electromagnetic Compatibility, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/136287-
dc.languageENG-
dc.titleDesign Comparison of I/O Port Ground and Power Plane for Enhanced ESD Immunity-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameEMC Europe 2002 International Symposium on Electromagnetic Compatibility-
dc.contributor.localauthorKim, Joungho-
dc.contributor.nonIdAuthorLee, Junho-
dc.contributor.nonIdAuthorKim, Tae Hong-
dc.contributor.nonIdAuthorKim, Hyungsoo-
dc.contributor.nonIdAuthorRyu, Woonghwan-
dc.contributor.nonIdAuthorChoi, Jae Chun-
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EE-Conference Papers(학술회의논문)
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