Effect of Gas Composition on UV-excited O2 GPC for the Removal of Organic Contaminants on a Silicon Wafer

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dc.contributor.authorKwon, S. K.-
dc.contributor.authorKim, DoHyun-
dc.date.accessioned2013-03-16T21:44:59Z-
dc.date.available2013-03-16T21:44:59Z-
dc.date.created2012-02-06-
dc.date.issued1999-10-
dc.identifier.citationProc. 12th Intern. Symposium on Chemical Engineering, v., no., pp.151 - 152-
dc.identifier.urihttp://hdl.handle.net/10203/136206-
dc.languageENG-
dc.titleEffect of Gas Composition on UV-excited O2 GPC for the Removal of Organic Contaminants on a Silicon Wafer-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage151-
dc.citation.endingpage152-
dc.citation.publicationnameProc. 12th Intern. Symposium on Chemical Engineering-
dc.contributor.localauthorKim, DoHyun-
dc.contributor.nonIdAuthorKwon, S. K.-
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CBE-Conference Papers(학술회의논문)
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