DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Man Cheol | - |
dc.contributor.author | Seong, Poong-Hyun | - |
dc.date.accessioned | 2013-03-16T21:21:13Z | - |
dc.date.available | 2013-03-16T21:21:13Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2002-07 | - |
dc.identifier.citation | The Conference of CUP's Nuclear I&C Subtask, v., no., pp. - | - |
dc.identifier.uri | http://hdl.handle.net/10203/136013 | - |
dc.language | ENG | - |
dc.title | Reliability Graph with General Gates: An Intuitive and Practical Method for General System Reliability Analysis | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | The Conference of CUP's Nuclear I&C Subtask | - |
dc.identifier.conferencecountry | Japan | - |
dc.identifier.conferencecountry | Japan | - |
dc.contributor.localauthor | Seong, Poong-Hyun | - |
dc.contributor.nonIdAuthor | Kim, Man Cheol | - |
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