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College of Engineering(공과대학)Dept. of Materials Science and Engineering(신소재공학과)MS-Conference Papers(학술회의논문)

Modeling of polarization behavior of ferroelectric thin film capacitor with inhomogeneous charged defect density and the polarization parameters

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dc.contributor.authorLee, Won Jong-
dc.contributor.authorKim, Yong Il-
dc.date.accessioned2013-03-16T20:42:54Z-
dc.date.available2013-03-16T20:42:54Z-
dc.date.created2012-02-06-
dc.date.issued2000-
dc.identifier.citation12th International Symposium on Integrated Ferroelectrics (ISIF2000), v., no., pp.361 - 361-
dc.identifier.urihttp://hdl.handle.net/10203/135629-
dc.languageENG-
dc.titleModeling of polarization behavior of ferroelectric thin film capacitor with inhomogeneous charged defect density and the polarization parameters-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage361-
dc.citation.endingpage361-
dc.citation.publicationname12th International Symposium on Integrated Ferroelectrics (ISIF2000)-
dc.identifier.conferencecountryGermany-
dc.identifier.conferencecountryGermany-
dc.contributor.localauthorLee, Won Jong-
dc.contributor.nonIdAuthorKim, Yong Il-
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MS-Conference Papers(학술회의논문)
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