Study on the Laminographic PCB Inspection System
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Cho, Gyuseong | - |
| dc.contributor.author | Jeon, SC | - |
| dc.contributor.author | Kim, HK | - |
| dc.contributor.author | Kim, YS | - |
| dc.contributor.author | Kwak, SW | - |
| dc.date.accessioned | 2013-03-16T16:00:24Z | - |
| dc.date.available | 2013-03-16T16:00:24Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2001 | - |
| dc.identifier.citation | iTRS Int. Symp. on Radiation Safety and Detection Technology, v., no., pp. - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/132908 | - |
| dc.language | KOR | - |
| dc.title | Study on the Laminographic PCB Inspection System | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | iTRS Int. Symp. on Radiation Safety and Detection Technology | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | Cho, Gyuseong | - |
| dc.contributor.nonIdAuthor | Jeon, SC | - |
| dc.contributor.nonIdAuthor | Kim, HK | - |
| dc.contributor.nonIdAuthor | Kim, YS | - |
| dc.contributor.nonIdAuthor | Kwak, SW | - |
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