MOS characteristics of NH3-nitrided N2O-annealed oxides fabricated at reduced pressure
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Yoon, Giwan | - |
| dc.date.accessioned | 2013-03-16T14:25:32Z | - |
| dc.date.available | 2013-03-16T14:25:32Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1999-09 | - |
| dc.identifier.citation | JPS, v., no., pp.330 - 332 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/132141 | - |
| dc.language | ENG | - |
| dc.title | MOS characteristics of NH3-nitrided N2O-annealed oxides fabricated at reduced pressure | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 330 | - |
| dc.citation.endingpage | 332 | - |
| dc.citation.publicationname | JPS | - |
| dc.contributor.localauthor | Yoon, Giwan | - |
- Appears in Collection
- EE-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.