Top-Down Attention Control at Feature Space for Robust Pattern Recognition

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dc.contributor.authorLee, SI-
dc.contributor.authorLee, Soo-Young-
dc.date.accessioned2013-03-16T14:04:12Z-
dc.date.available2013-03-16T14:04:12Z-
dc.date.created2012-02-06-
dc.date.issued2000-05-
dc.identifier.citationBiologically-Motivated Computer Vision, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/131960-
dc.languageENG-
dc.titleTop-Down Attention Control at Feature Space for Robust Pattern Recognition-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameBiologically-Motivated Computer Vision-
dc.identifier.conferencecountrySouth Korea-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthorLee, Soo-Young-
dc.contributor.nonIdAuthorLee, SI-
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EE-Conference Papers(학술회의논문)
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